Showing results: 3736 - 3750 of 5362 items found.
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Maxcom Inc.
With six wavelength calibrating spots (980nm, 1310nm, 1490nm, 1550nm, 1590nm and 1610nm), refined design, easy operation, linearity or non-linearity display, SC connector, the MXOPM26-50 hand-held optical power meter can be used for direct optical power measurement as well as relative measurement of optical link loss. It’s an essential test instrument in Optical Communication systems, CATV systems, construction and maintenance applications and more.
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Abaco Systems Inc
Abaco Systems' BusTools-1553 is an integrated, Microsoft Windows-based, application solution for MIL-STD-1553 test, analysis and simulation. BT-1553 software harnesses the power of Abaco Systems' hardware interfaces on PCI, PCI Express, CompactPCI, PMC, ExpressCard, PCMCIA, USB, XMC, PC/104-Plus, VME and VXI platforms for simplified control over simulation, display, data logging, playback, and protocol analysis of MIL-STD-1553/1760 A and B networks.
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Precision Development Consulting Inc
Hand control module for teleprompter, Analog data acquisition and filtering, High-Power Arc Lamp Power Supply Controller and RTP gas flow and Vacuum System controller, Disk drive company test racks, Disk Drive Spindle Motor Tester, Disk Drive Head Stack Tester, Wafer photoresist coating and development system control PC boards, Nuclear Plant secondary water temperature monitor
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65VP1 -
North Atlantic Industries
NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.
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40-613A-002 -
Pickering Interfaces Ltd.
The 40-613A Very High Density Versatile 2-pole Multiplexer module features a wide range of software selectable switching configurations. It is especially useful where a number of high density multiplexers are required with the option of easily altering the channel count as a test system evolves.
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Lisun Electronics Inc.
Designed to have a capability of producing any visible spectral distribution, mimicking various light sources in the visible region by feedback control of the radiant power emitted by individual LEDs. This LED test system will be used as a transfer standard for photometric, colorimetric and radiometric applications.
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40-618-001 -
Pickering Interfaces Ltd.
The 40-618 PXI Source Switching Module consists of 12 separate 4-channel multiplexers and 44 uncommitted SPST relay contacts in a single width PXI module. Typical applications include signal routing for avionics test systems that conform to the ARINC 608A specification.
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BroadWave Technologies, Inc.
BroadWave designs and manufactures RF Detectors and other coaxial RF components that are ideally suited for test, verification and system integration. With frequency ranges of DC to 18 GHz, our components offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.
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BroadWave Technologies, Inc.
BroadWave designs and manufactures DC Blocks and other coaxial RF components that are ideally suited for test, verification and system integration. With frequency ranges of DC to 18 GHz, our components offer consistent performance at a low cost with an emphasis on performance and configuration flexibility.
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Sciencescope International
Scienscope’s X-Ray inspection systems division offers state of the art X-ray cabinet systems with the highest performance to price ratio in the industry today. Scienscope has over 16 years of experience selling solutions as a leading NDT (non-destructive test) supplier of x-ray inspection equipment into the electronic, medical device, materials, and biological markets. Our advanced x-ray systems feature high power micro-focus x-ray sources up to 130kV, high resolution digital detectors, large inspection stages with 350° degrees rotation, oblique angle inspection, and all of the manual and automated s/w tools you expect in an advanced system are included.
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780319-01 -
NI
1 GHz, 2 GS/s, 8-Bit, 8 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-03 -
NI
1 GHz, 2 GS/s, 8-Bit, 256 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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780319-02 -
NI
1 GHz, 2 GS/s, 8-Bit, 64 MB/ch, PXI Oscilloscope—The PXI‑5154 is ideal for acquisition and characterization of fast, nanosecond-edge speeds. It is well-suited for automated test and data streaming applications in the consumer electronics, semiconductor, aerospace/defense, and life sciences industries. The PXI‑5154 also comes equipped with up to 256 MB of memory per channel to provide high, sustained sample rates over extended data capture windows. This digitizer, optimized for automated test, uses a high-throughput bus to lower test times, provides picosecond-level synchronization among modules, and integrates with the entire suite of NI hardware, so you can build and customize a complete mixed-signal or high‑channel‑count test system.
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Model 3911 -
Jinan Testing Equipment IE Corporation
For indirect tensile testing, such as for resilient modulus, these extensometers measure the lateral deformation of specimens. They are self-supporting on the sample and clip on in seconds. The traditional way this deformation has been measured was prone to errors caused by slight rocking of the sample as it is loaded. The self-supporting design of the Model 3911 eliminates this problem. This unit will handle the dynamic pulse requirements of resilient modulus testing.The speed of mounting makes test set-up much faster than with the older method. The pivot mounting used ensures that the specimen contact pads meet the often uneven asphalt surface as well as possible. The measuring range options available allow a wide range of testing, yet can easily measure the sometimes very small displacements required.The Model 3911 extensometers are strain gaged devices, making them compatible with any electronics designed for strain gaged transducers. Most often they are connected to a test machine controller. The signal conditioning electronics for the extensometer is typically included with the test machine controller or may often be added. In this case the extensometer is shipped with the proper connector and wiring to plug directly into the electronics. For systems lacking the required electronics, Epsilon can provide a variety of solutions, allowing the extensometer output to be connected to data acquisition boards, chart recorders or other equipment.
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LSG-1200A -
Lisun Electronics Inc.
The compact goniophotometer of LSG-1200A is used to measure the luminous intensity distribution curve, intensity data, spread angle and other parameters for Chip LED, LED Module, LED Spotlight and all other light which beam angle is no more than 180 degree. • Meets the requirements of IEC, CIE and LM-79 standards • Measures beam angle automatically: staple half intensity angle as well as 1/4 intensity angle, 3/4 intensity angle and 1/10 intensity angle which meets the special requirements. • Measured data is matched with international standard form (IES) and can be applied for lighting design by other lighting design software such as DiaLux • LSG-1200A has included a dark room, measures the maximum size of lamps: 180mm • Test range of luminosity: 0.1～30,000lx. Test accuracy of detector: Class 1 • The distance between the tested lamp and detector is 316mm/1000mm • Angle interval: Horizontal angle: 1°/5°/10°/15°/22.5°/30°/45°/90°, Vertical angle: 0.5°/2°/1.5° • The LSG-1200A horizontal automatic rotating on 0°~360° and Vertical automatic rotating on -90°~+90° • Test accuracy of angle: ±0.2° Work with the follow instruments as a System
